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題名作者日期
Don’t-Care Bits Filling for Capture Power ReductionLee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr; Xie, Zheng-Yi Jr2011-03-24T23:37:50Z
SOCs Test Scheduling using TAM SwitchLee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr; Zhang, Zheng-Han Jr2011-03-24T23:37:57Z