瀏覽 的方式: 關鍵字 automated test equipment (ATE)
顯示 1 到 2 筆資料,總共 2 筆
題名 | 作者 | 日期 |
---|---|---|
2n Pattern Run-Length for Test Data Compression | Chang, Cheng-Ho Jr; Lee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr | 2011-01-21T01:16:30Z |
Cascaded Broadcasting for Test Data Compression | Chang, Cheng-Ho Jr; Lee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr | 2011-01-21T01:12:13Z |