題名: Development and Application of the Logical Structures of IEEE Safety Standards
作者: Lien, Kuo-Ting
Yih, Swu
Tseng, Wan-Hui
Fan, Chin-Feng
Wu, Yi-Chen
關鍵字: Common Criteria CC
safety
IEEE 603
security
Requirement documentation
期刊名/會議名稱: 2008 ICS會議
摘要: Safety and security are two relevant properties to software quality. The security area has Common Criteria (CC) for producing and review of security requirement documents. However, the safety area lacks such a standard for users to construct safety documentation. Thus, based on the structures of common criteria, we proposed a logical structure of IEEE 603, a safety standard for nuclear power station. The required items are extracted and represented by CC-like classes, families, and components. Moreover, we used UML diagrams to express the relationship within the logical structures and their components. Based on these proposed components, we developed a method to asses the safety level of the reviewed documentation. Our approach enhances the readability and structures of safety documents and also improves review efficiency.
日期: 2009-01-20T09:18:12Z
分類:2008年 ICS 國際計算機會議

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