完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lei, Yao-Cheng | |
dc.contributor.author | Lin, Nai-Wei | |
dc.date.accessioned | 2009-06-02T07:05:17Z | |
dc.date.accessioned | 2020-05-25T06:48:20Z | - |
dc.date.available | 2009-06-02T07:05:17Z | |
dc.date.available | 2020-05-25T06:48:20Z | - |
dc.date.issued | 2009-02-10T06:46:59Z | |
dc.date.submitted | 2009-02-09 | |
dc.identifier.uri | http://dspace.lib.fcu.edu.tw/handle/2377/11146 | - |
dc.description.abstract | This article describes a semiautomatic test case generation tool for Java classes based on UML sequence diagrams. Sequence diagrams are used to specify dynamic behaviors among objects. This tool is developed to facilitate the semiautomatic generation of test cases in integration testing level. This tool automatically generates a suite of test paths from sequence diagrams. Given an input data and the corresponding expected output data for each test path from the user, this tool automatically generates a Java method that executes the test path. This tool generates Java test classes for the JUnit framework. | |
dc.description.sponsorship | 淡江大學,台北縣 | |
dc.format.extent | 7p. | |
dc.relation.ispartofseries | 2008 ICS會議 | |
dc.subject | UML | |
dc.subject | sequence diagrams | |
dc.subject | test case generation | |
dc.subject.other | Software Engineering | |
dc.title | Semiautomatic Test Case Generation Based on Sequence Diagrams | |
分類: | 2008年 ICS 國際計算機會議 |
文件中的檔案:
檔案 | 描述 | 大小 | 格式 | |
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ce07ics002008000062.pdf | 294.04 kB | Adobe PDF | 檢視/開啟 |
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