Deterministic Test Pattern Generation using Segmented LFSR

Abstract

A new test data generation technique combining traditional internal liner feedback shift register (LFSR) with a specific polynomial LFSR, is presented in this work. The specific polynomial LFSR (SP-LFSR) method explores the distributions of 0’s and 1’s in each column and logically gathers the columns with mostly 0’s or 1’s for generation. This approach reduces more test time than the traditional LFSR does. Most previous techniques reduce test application time at the expense of hardware overhead. In our new method, we analyze the test data and reorder the scan chain into two parts while feeding the test data. The hardware overhead is low, only some inverters and XOR gates are required.