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符合的文件：
題名作者日期
Measurements and Preparation of Optical Long-Wave Pass Filters田春林03-19-19
Measurement of Residual Stress of Thin Film Coated on Silicon Wafer by Fringe Reflectometry and Fast Fourier Transform Method田春林12-05-19
Measurement of Surface Contour of Large Substrate Using Fringe Reflectometry and Subaperture Stitching田春林12-05-19
Reduction of Residual Stress and Surface Roughness for Preparing Optical Long-Wave Pass Filters田春林12-05-19
Measurement and Prediction of Residual Stress in the Mid-Infrared (SiO2/Ge)^x Multilayer Thin Films田春林12-05-19
光學多層薄膜SiO2(Ge/SiO2)^11沉積在不同基板之熱應力量測田春林11-01-19
Detection of NaCl Solution Concentration Based on Lossy Mode Resonance田春林12-05-19
中紅外波段抗反射多層膜製備及特性檢測田春林11-01-19
D型光纖鍍膜製作土壤濕度感測器田春林11-01-19