瀏覽 的方式： 作者 Lin, Rung-Bin Jr
顯示 1 到 5 筆資料，總共 5 筆
| 題名 | 作者 | 日期 |
| 2n Pattern Run-Length for Test Data Compression | Chang, Cheng-Ho Jr; Lee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr | 2011-01-21T01:16:30Z |
| Cascaded Broadcasting for Test Data Compression | Chang, Cheng-Ho Jr; Lee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr | 2011-01-21T01:12:13Z |
| Deterministic Test Pattern Generation using Segmented LFSR | Lee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr; Chen, You-An Jr | 2011-03-24T23:37:15Z |
| Don’t-Care Bits Filling for Capture Power Reduction | Lee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr; Xie, Zheng-Yi Jr | 2011-03-24T23:37:50Z |
| SOCs Test Scheduling using TAM Switch | Lee, Lung-Jen Jr; Tseng, Wang-Dauh Jr; Lin, Rung-Bin Jr; Zhang, Zheng-Han Jr | 2011-03-24T23:37:57Z |
