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dc.contributor.authorSun, Chang-ai
dc.contributor.authorSim, Kwan Yong
dc.contributor.authorTse, T.H.
dc.contributor.authorChen, T.Y.
dc.date.accessioned2009-06-02T06:40:09Z
dc.date.accessioned2020-05-25T06:41:52Z-
dc.date.available2009-06-02T06:40:09Z
dc.date.available2020-05-25T06:41:52Z-
dc.date.issued2006-10-16T06:01:32Z
dc.date.submitted2004-12-15
dc.identifier.urihttp://dspace.lib.fcu.edu.tw/handle/2377/1613-
dc.description.abstractBoolean expressions are extensively used in software specifications. It is important to generate a small-sized test set for Boolean expressions without sacrificing the fault-detection capability. MUMCUT is an efficient test case generation strategy for Boolean expressions in Irreducible Disjointed Normal Form (IDNF). In the real world, however, Boolean expressions written by a software designer or programmer are not normally in IDNF. In this paper, we apply MUMCUT to generate test cases for general Boolean expressions and develop a mutation-based empirical evaluation on the effectiveness of this application. The experimental data show that MUMCUT can still detect single seeded faults in up to 98.20% of general Boolean expressions. We also analyze patterns where test cases generated by MUMCUT cannot detect the seeded faults.
dc.description.sponsorship大同大學,台北市
dc.format.extent7p.
dc.format.extent242485 bytes
dc.format.mimetypeapplication/pdf
dc.language.isozh_TW
dc.relation.ispartofseries2004 ICS會議
dc.subjectTest Case Generation
dc.subjectBoolean Specifications
dc.subjectSoftware Testing
dc.subject.otherMiscellaneous
dc.titleAn Empirical Evaluation and Analysis of the Fault-Detection Capability of MUMCUT for General Boolean Expressions
分類:2004年 ICS 國際計算機會議

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