題名: | An Empirical Evaluation and Analysis of the Fault-Detection Capability of MUMCUT for General Boolean Expressions |
作者: | Sun, Chang-ai Sim, Kwan Yong Tse, T.H. Chen, T.Y. |
關鍵字: | Test Case Generation Boolean Specifications Software Testing |
期刊名/會議名稱: | 2004 ICS會議 |
摘要: | Boolean expressions are extensively used in software specifications. It is important to generate a small-sized test set for Boolean expressions without sacrificing the fault-detection capability. MUMCUT is an efficient test case generation strategy for Boolean expressions in Irreducible Disjointed Normal Form (IDNF). In the real world, however, Boolean expressions written by a software designer or programmer are not normally in IDNF. In this paper, we apply MUMCUT to generate test cases for general Boolean expressions and develop a mutation-based empirical evaluation on the effectiveness of this application. The experimental data show that MUMCUT can still detect single seeded faults in up to 98.20% of general Boolean expressions. We also analyze patterns where test cases generated by MUMCUT cannot detect the seeded faults. |
日期: | 2006-10-16T06:01:32Z |
分類: | 2004年 ICS 國際計算機會議 |
文件中的檔案:
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ce07ics002004000159.pdf | 236.8 kB | Adobe PDF | 檢視/開啟 |
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