題名: An Empirical Evaluation and Analysis of the Fault-Detection Capability of MUMCUT for General Boolean Expressions
作者: Sun, Chang-ai
Sim, Kwan Yong
Tse, T.H.
Chen, T.Y.
關鍵字: Test Case Generation
Boolean Specifications
Software Testing
期刊名/會議名稱: 2004 ICS會議
摘要: Boolean expressions are extensively used in software specifications. It is important to generate a small-sized test set for Boolean expressions without sacrificing the fault-detection capability. MUMCUT is an efficient test case generation strategy for Boolean expressions in Irreducible Disjointed Normal Form (IDNF). In the real world, however, Boolean expressions written by a software designer or programmer are not normally in IDNF. In this paper, we apply MUMCUT to generate test cases for general Boolean expressions and develop a mutation-based empirical evaluation on the effectiveness of this application. The experimental data show that MUMCUT can still detect single seeded faults in up to 98.20% of general Boolean expressions. We also analyze patterns where test cases generated by MUMCUT cannot detect the seeded faults.
日期: 2006-10-16T06:01:32Z
分類:2004年 ICS 國際計算機會議

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